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Characterization and modelling

Characterization and modelling

Creating chemical images, solving industrial problems

16 Aug 2018
This article first appeared in the 2018 Physics World Focus on Instruments and Vacuum under the headline "Creating chemical images"

David J Scurr and Matthew Piggott describe how time-of-flight secondary ion mass spectrometry is helping scientists in a variety of industries to understand problems related to materials science

using ToF-SIMS
Making maps: Interrogating the chemical distribution of components of a pharmaceutical tablet using ToF-SIMS. (Courtesy: University of Nottingham)
Materials characterization has long been a go-to approach to support hi-tech manufacturing. The incr

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David J Scurr is a senior research fellow in surface analysis and Matthew Piggott is business manager at the Interface and Surface Analysis Centre within the University of Nottingham’s School of Pharmacy, UK, e-mail david.scurr@nottingham.ac.uk
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