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Semiconductors and electronics

Semiconductors and electronics

Atomic force microscope makes single-electron current meter

23 Apr 2018 Isabelle Dumé
IBM researchers
IBM researchers Shadi Fatayer, Leo Gross and Gerhard Meyer in their lab. Courtesy: IBM
An atomic force microscope can be used as a single-electron current meter, according to new experime

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Isabelle Dumé is a contributing editor to Physics World
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